Cryo preparation techniques for scanning electron microscopy (SEM) are essential for the successful observation of wet or ‘beam sensitive’ specimens. Cryo-SEM removes the need for specimen-unfriendly conventional preparation techniques, such as critical point drying, allowing observation of specimens in a close-to-life hydrated state. Responsable : Carvalho Alain Localisation : F134
Visiblité : externe
Provenance : fabricant
Réservable : non